ROCHESTER, N.Y., June 9 /PRNewswire/ -- Chapman Instruments, a leading
global supplier of non-contact, non-destructive critical metrology measurement
system is honoured as a TIS Award winner at SEMICON West 2005 for its
exceptional contribution in the field of non-destructive thickness metrology.
TIS recognizes innovative products which are new inventions and provide
practical solutions to real problems in the semiconductor and /or related
industries. The TIS award acknowledges Chapman's innovative solutions and
pursuit of non-contact and non-destructive metrology equipment to the
semiconductor industry.
"On behalf of Chapman's employees, I am pleased to join TIS and selected
as a Winner," said Thomas C. Bristow, CEO and President of Chapman
Instruments. "Chapman Instruments has consistently been a leader, providing
non-contact surface topography instrumentation in the semiconductor industry
since 1989, with solutions to both wafer manufacturers and backend
semiconductor segments. TIS recognizes Chapman as an innovative manufacturer
and we are proud to join with other semiconductor companies in this award
program."
Chapman's new thickness product offers the semiconductor industry both the
capability for today as well as future advanced semiconductor needs, offering
non-destructive solutions for semiconductor production and R&D. Chapman's
system supports accelerating yield enhancement through a unique non-contact
thickness measurement at any location on the wafer. Chapman Instruments'
products incorporate the company's patented dual beam laser technology,
providing remarkable accurate measurement capability on wafers and
accelerating a customer's return on its investment.
Chapman Instruments -- Beyond Measurement
About Chapman:
Chapman Instruments is a leading manufacturer of non-contact non-
destructive critical metrology measurement systems. As a specialist of premium
measurement equipment it is dedicated to developing and manufacturing
innovative, easy-to-use non-contact wafer inspection systems. Chapman is a
world-wide source for laboratories, R & D and in-line production for semi-
automated to fully automated surface profilers and future wafer thickness
systems. Chapman Instruments focuses on customer communication to assure
quality and innovation today as well as meeting future customer's need.
Contact:
Chapman Instruments
Traudi Mollner
3 Townline Circle
Rochester, NY 14623-2537
United States of America
Phone: (585) 424 1380
Fax: (585) 424 2142
http://www.chapinst.com
E-Mail: Traudi.Mollner@chapinst.com
SOURCE Chapman Instruments
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Related links:
http://www.chapinst.com
http://wps2a.semi.org/wps/portal/_pagr/123/_pa.123/302
CONTACT:
Traudi Mollner of Chapman Instruments,
+1-585-424-1380, Fax, +1-585-424-2142,
Traudi.Mollner@chapinst.com
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