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LogicVision Showcases High-Speed I/O Test Technology at SEMICON West Conference

    Company's Breakthrough Technology Selected for Prestigious Technology
                             Innovation Showcase

    SAN JOSE, Calif., July 7 /PRNewswire-FirstCall/ -- LogicVision, Inc.
(Nasdaq: LGVN), a leading provider of yield learning capabilities that enable
its customers to quickly and efficiently improve product yields, today
announced its innovative high speed embedded SerDes I/O test technology has
been selected as one of the emerging technologies to be highlighted in the
Technology Innovation Showcase (TIS) at SEMICON West, July 12 - 14.  The TIS
will be located in the Emerging Technologies Hall, Esplanade, at Moscone
Center in San Francisco. TIS winners are selected by a jury of technologists
for the promise their innovations hold for the future of microelectronics and
nano-electronics manufacturing.
    The TIS includes technical presentations and an exhibit pavilion featuring
displays from each of the participating companies and organizations.  Stephen
Sunter, an engineering director at LogicVision, will be presenting Embedded
SerDes Test on the TIS stage on Thursday July 14th at 12:50pm.
    LogicVision's Embedded SerDes Test (EST) product is an IP-based technology
that provides unique capabilities for testing ICs with an unlimited number of
high-speed serial data channels operating at any frequency, from less than 1
Gbps to more than 10 Gbps. EST provides test accuracy comparable to that of
the highest performance external equipment, but is compatible with any ATE
platform. The ability of EST to diagnostically measure waveshape, jitter, and
jitter tolerance, in millisecond test times, can improve yield and quality,
and reduce test cost. The technology has been verified in silicon on SerDes
channels running over 3 Gbps.

    About LogicVision
    LogicVision, Inc. (Nasdaq: LGVN), provides unique yield learning
capabilities in the design for manufacturing space. These capabilities enable
its customers, leading semiconductor companies, to more quickly and
efficiently learn to improve product yields. The company's advanced Design for
Test (DFT) product line, ETCreate, works together with ETAccess and SiVision
yield learning applications to enable increased profit by reducing device
field returns, reducing test costs, and accelerating both time to market and
time to yield. LogicVision solutions are used in the development of
semiconductor ICs for products ranging from digital consumer goods to wireless
communications devices and satellite systems. LogicVision was founded in 1992
and is headquartered in San Jose, Calif. For more information visit
http://www.logicvision.com

    FORWARD LOOKING STATEMENTS: Except for the historical information
contained herein, the matters set forth in this press release, including
statements as to the expected features and benefits of the company's products
and technology, such as improvements in yield and quality and reductions in
test costs, are forward-looking statements within the meaning of the Private
Securities Litigation Reform Act of 1995. These forward-looking statements are
subject to risks and uncertainties that could cause actual results to differ
materially, including, but not limited to, the impact of competitive products
and technological advances, including changes in ATE platforms, and other
risks detailed in Form 10-Q for the quarter ended March 31, 2005, and from
time to time in LogicVision's SEC reports. These forward-looking statements
speak only as of the date hereof. LogicVision disclaims any obligation to
update these forward-looking statements.


SOURCE LogicVision, Inc.




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Related links:
  • http://www.logicvision.com
    CONTACT:
    Kirsten McMullen, Marketing Manager of
    LogicVision, +1-408-452-2453, kirsten@logicvision.com