Solutions Address Variety of Markets, Illustrating Breadth of Company's Test
Capabilities
SANTA CLARA, Calif., July 11 /PRNewswire-FirstCall/ -- Advantest
Corporation (TSE: 6857, NYSE: ATE), the world's largest supplier of
semiconductor test equipment, today announced it will showcase the latest
additions to its portfolio of advanced automated test equipment (ATE) during
SEMICON West 2005, July 12-14, at the Moscone Convention Center in San
Francisco. The company will feature solutions that help lower the cost of
test and boost productivity for a variety of applications, including systems-
on-chip (SoCs) with advanced communications interfaces, radio-frequency (RF)
modules for wireless local-area networks (WLANs), and sophisticated chip
packages. Further, this year's offerings serve to highlight the rapidly
growing capabilities for Advantest's T2000 open-test platform based on the
OPENSTAR(TM) standard, illustrating the T2000's flexibility and expandability.
According to Keith Lee, president and CEO of Advantest America, Inc.,
"Advantest has always led with innovation-we are renowned for our quality and
reliability, and we've made competitive cost of ownership a hallmark of our
test solutions. In today's fab flow, particularly with burgeoning
semiconductor variety and complexity, the ability to test and know the
integrity of devices in a production environment is critical. We are pleased
to continue delivering high-value products to customers in our served markets,
sustaining our position as the test-industry leader in technology, reliability
and cost-effectiveness."
At the show, Advantest will introduce its first-ever digital test module
for systems-on-chip (SoCs) incorporating advanced serializer/deserializer
(SerDes) communications interfaces, which enable increased bandwidth and
reduced board footprint in microprocessors, chipsets and similar devices.
Advantest's 6.5Gbps digital module provides a flexible, affordable solution
for testing embedded clock SerDes devices, common clock logic devices, and
source-synchronous devices-all on the T2000 platform. The high-speed 6.5GDM's
stellar technical capabilities facilitate device characterization and
production testing, and its unique header-hunt feature enables data tracking
even when the data itself is non-deterministic in nature. (More information
can be found in a separate release: "Advantest Targets Advanced SerDes Device
Testing with T2000 Test Module.")
Another new open-test capability debuting at SEMICON West is RF testing
for high-speed WLANs. According to Research and Markets, WLAN equipment sales
have jumped 60 percent in the past year, and this market is projected to reach
nearly $5 billion by 2006. With these growth figures, WLAN technology
providers need affordable, reliable test systems to speed time to market for
their products. Advantest has used its unique T2000 PXI Carrier module,
designed specifically for rapid solution development, to provide an RF and
baseband Wireless LAN transceiver test solution on the T2000. The PXI Carrier
greatly enhances the capabilities of the OPENSTAR test system. Key features
include RF testing to 6GHz, PXI carrier versatility, and baseband sample rates
of 200Ms/s with a 16-bit arbitrary waveform generator (AWG) and a 12-bit
digitizer.
Also on display in Advantest's booth at SEMICON West will be the first
OPENSTAR-compliant third-party module. The new module, developed by a
supplier of mixed-signal instrumentation products, enhances the ability of the
OPENSTAR-based test systems such as the T2000 to economically meet the
diverse, stringent mixed-signal test requirements for baseband products such
as Gigabit Ethernet, DVD and digital television. According to the
Semiconductor Test Consortium (STC), the module is the first of many fully
integrated high-performance modules being designed for deployment in OPENSTAR-
compliant testers.
In addition to its test-system expertise, Advantest is the market leader
in pick-and-place handlers, with a share exceeding 40 percent. At the show,
the company will feature its premier vision alignment handler, the M4741A.
Delivering the industry's highest utilization and lowest cost of test, the
M4741A performs dynamic vision alignment for <0.5mm fine-pitch devices
configured in high-density IC packages, including chip-scale and quad-flat
packages (CSPs and QFPs) and ball-grid arrays (BGAs). Throughput exceeds
4,000 units per hour when performing simultaneous testing of four devices,
ensuring rapid time to market for these advanced device packages essential to
a variety of handheld consumer products requiring highly miniaturized, power-
efficient semiconductors, including cell phones, PDAs and notebook computers.
Editors, analysts and others interested in learning more about Advantest's
advanced product portfolio are encouraged to visit Booth #7721 in the West
Hall of Moscone Center, or contact Ellen Van Etten of MCA at (650) 968-8900;
email: evanetten@mcapr.com.
About Advantest
Advantest Corporation is the world's largest supplier of automatic test
equipment to the semiconductor industry. Advantest's SoC, logic, memory,
mixed-signal and RF testers and device handlers are integrated into the most
advanced semiconductor fabrication lines in the world. Founded in Tokyo in
1954, Advantest established its North American subsidiary in 1982 and its
European subsidiary in 1984. More information is available at
http://www.advantest.com
NOTE: OPENSTAR is a registered trademark of Semiconductor Test
Consortium, Inc.
SOURCE Advantest Corporation
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Related links:
http://www.advantest.com
CONTACT:
Amy Gold of Advantest America, Inc.,
+1-212-850-6670, or a.gold@advantest.com; or Ellen Van Etten of
MCA, +1-650-968-8900, or evanetten@mcapr.com, for Advantest
Corporation
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