SAN FRANCISCO, July 11 /PRNewswire-FirstCall/ -- Nextest Systems
Corporation (Nasdaq: NEXT), a leading manufacturer of automatic test
equipment (ATE) for cost-sensitive semiconductors, announced that it will
exhibit a range of test solutions at the SEMICON West trade show being held
at the Moscone West Convention Center in San Francisco, California, July
11-13, 2006. The conference provides a unique environment for semiconductor
equipment makers to promote their company to customers from around the
world. Showcased in Nextest's booth #8241, at SEMICON West, are the
following test solutions:
MAGNUM GRANDE(TM)
On display for the first time, the Magnum Grande will be integrated
with a 720-site, TechWing TW-380 handler. The systems will feature 720-NAND
Flash packaged devices -- to date, the largest number being tested in
parallel. This is more than double the number Nextest demonstrated one-year
ago at SEMICON West 2005, and provides Flash manufacturers with a
significant 25% reduction in test costs. Additionally, Grande consumes no
additional floor space over the Magnum GV and utilizes the same operating
software, test programs, internal components and spare parts -- thus
eliminating additional costs associated with training and inventory of
spares.
Designed for massively parallel test applications, Grande boasts up to
7,680 I/O pins and 960 sites. The twelve-chassis system provides IC
manufacturers the largest number of test pins available in a single test
head today.
LIGHTNING PT(TM)
Also on demonstration at SEMICON West is the Lightning PT test system.
To further support the company's theme at the show: "Raising the Par",
Nextest's booth has been transformed into the likeness of a golf course.
Show attendees are invited to test their swing at a golf ball by using a
special golf club -- while Lightning is busy testing and measuring the
velocity of their swing. Lightning achieves this through the two-MEMS
devices that are cleverly embedded in the golf club and directly linked
through the shaft to the tester.
Lightning, is designed to address the test requirements of system-on-a-
chip (SOC) and system-in-a-package (SIP) technologies, and provides logic,
memory and analog test capability at a low cost of test.
ABOUT NEXTEST
Nextest Systems Corporation is a low-cost leader in the design and
manufacture of automatic test equipment (ATE) for Flash memory and
System-On- Chip semiconductors. Nextest's products address the growing
demand from manufacturers for ATE with increased throughput, functionality
and reliability, while reducing time to market and cost of test. Nextest
has shipped over 1,500 systems worldwide. Further information is available
at http://www.nextest.com.
Contact: Connie Graybeal-Berar of GEM Design & Public Relations,
+1-408-529-4694, for Nextest.
SOURCE Nextest Systems Corporation
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Related links:
http://www.nextest.com/
CONTACT:
Connie Graybeal-Berar of GEM Design & Public
Relations, +1-408-529-4694, or cberar@mac.com, for Nextest
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