New Magnum Grande enables test-cost reduction by offering a fully
integrated solution for testing 720 NAND Flash parts in parallel.
SAN FRANCISCO, July 11 /PRNewswire-FirstCall/ -- Nextest Systems
Corporation (Nasdaq: NEXT), a leading manufacturer of automatic test
equipment (ATE) for cost-sensitive semiconductors, announced today the
introduction of its newest member of the Magnum family, Magnum Grande.
Grande, integrated with a TechWing handler, will be showcased in Booth
#8241 at the SEMICON West trade show. The conference is being held at the
Moscone West Convention Center in San Francisco, California, July 11-13,
2006.
On display for the first time, the Grande will be integrated with a
TechWing TW-380 handler. This highly parallel test solution is capable of
testing 720 NAND Flash devices at one time -- more than doubling the
configuration Nextest demonstrated only one year ago at SEMICON West 2005.
This is the largest capacity tester/handler configuration available today.
Robin Adler, CEO of Nextest Systems Corporation, commented, "Our legacy
and commitment to our customers is to provide test solutions that are
simple and efficient in design, with advanced product innovation and
reliability -- and all at the lowest cost of test possible. We believe
Grande has raised the bar to a new level in package test. As ASP's continue
to erode in Flash, collaboration with customers and other equipment
providers is crucial as we develop solutions that drive down test costs.
That's what we do best at Nextest."
Magnum Grande, designed for massively parallel test applications,
brings a new dimension in testing solutions for the rapidly growing Flash
marketplace. With up to 7,680 I/O pins and 960 sites, the twelve-chassis
system provides IC manufacturers the largest number of pins, and maximized
test capacity, available in a single test head. This unprecedented level of
integration brings with it a 25% test cost reduction over last year's
320-site configuration. Magnum Grande does all this with the same floor
space, operating software, test programs, and spare parts as the Magnum GV
-- thus eliminating any additional operating costs.
The key to Magnum's success is its unique architecture. Each Magnum
system is built from a set of "Site Assemblies." Each Site Assembly
contains all of the data generation, error processing, timing and DC
resources required to test a wide variety of devices, including both NAND
and NOR Flash memories. Each Site Assembly also includes an embedded 1.2Ghz
PC for high efficiency and local control of the test process -- therefore,
keeping parallel-test overhead to the lowest level in the ATE industry.
Magnum Grande systems are available today at prices starting at less
than $400 per-pin.
ABOUT NEXTEST
Nextest Systems Corporation is a low-cost leader in the design and
manufacture of automatic test equipment (ATE) for Flash memory and
System-On- Chip semiconductors. Nextest's products address the growing
demand from manufacturers for ATE with increased throughput, functionality
and reliability, while reducing time to market and cost of test. Nextest
has shipped over 1,500 systems worldwide. Further information is available
at http://www.nextest.com.
Nextest Agency Contact:
GEM Design & Public Relations
Connie Graybeal-Berar
408.529.4694
SOURCE Nextest Systems Corporation
 back to top
Related links:
http://www.nextest.com/
CONTACT:
Connie Graybeal-Berar of GEM Design & Public
Relations, +1-408-529-4694 or cberar@mac.com, for Nextest Systems
Corporation
|
