MILPITAS, Calif., July 11 /PRNewswire-FirstCall/ -- Credence Systems
Corporation (Nasdaq: CMOS), a leading provider of test solutions from
design to production for the worldwide semiconductor industry, today at
SEMICON/West introduced the latest addition to its industry-leading
Sapphire(TM) platform, the Sapphire D-40.
Combining analog, digital, mixed-signal and RF test instrumentation,
the Sapphire D-40's high-density technology delivers a competitive
performance/cost ratio alternative. Leveraging the proprietary Credence
integrated technologies first introduced in the award-winning Sapphire
D-10, the Sapphire D-40 enables the analog and mixed-signal scalability
needed to balance device manufacturers' challenges for SiP and MCP device
integration and test costs.
The Sapphire D-40 offers enhanced data management and parallel test
capabilities that translate into high throughput efficiencies. As a result,
the Sapphire D-40 delivers four times the test performance of the Sapphire
D- 10, with a 25 percent increase in platform footprint.
"Growth in the semiconductor industry is increasingly driven by
consumer- oriented devices and applications such as MP3 players, mobile
phones and a multitude of other portable electronic appliances," said Dave
Ranhoff, president and chief executive officer of Credence Systems
Corporation. "The high-density technology in the Sapphire D-40 enables data
I/O scaling to deliver superior multi-site economics. This creates new
opportunities for managing the aggressive test cost targets that are key to
bringing innovative portable technologies to the consumer market."
The Sapphire D-40 leverages a unique combination of Credence IP and
broad- based industry standards to allow users to grow data path bandwidth
and power availability in segments as test needs grow. As a result, the
Sapphire D-40 provides unparalleled levels of test efficiency at an
industry-leading cost, regardless of the level of test requirements.
"What we've done with the Sapphire D-40 is create a highly scalable
data infrastructure, similar to that used on the Internet," continued
Ranhoff. "Every time you add another module or instrument to the system,
you add more data bandwidth."
The Sapphire D-40 has leveraged cPCI standards to deliver a solution
that works on a widely available instrument I/O standard supported by
hundreds of companies. The Sapphire D-40 is designed to move test data
rapidly from the devices under test, through instruments and into test
processors. With more than 2048 200 Mbps digital pins and high-density,
mixed-signal instruments, the Sapphire D-40 also features dedicated highly
accurate analog instruments and up to 32 ports of MVNA-enabled RF.
About Credence
Credence Systems Corporation is a leading provider of debug,
characterization and ATE solutions for the global semiconductor industry.
With a commitment to applying innovative technology to lower the
cost-of-test, Credence delivers competitive cost and performance advantages
to integrated device manufacturers (IDMs), wafer foundries, outsource
assembly and test (OSAT) suppliers and fabless chip companies worldwide. A
global, ISO 9001- certified company with a presence in 20 countries,
Credence is headquartered in Milpitas, California. More information is
available at http://www.credence.com.
Credence is a registered trademark, and Credence Systems, Sapphire and
MVNA are trademarks of Credence Systems Corporation. Other trademarks that
may be mentioned in this release are the intellectual property of their
respective owners.
Media Relations Contact:
Judy Dale
Vice President, Marketing Communications and Investor Relations
Credence Systems Corporation
Phone: 408-635-4309
FAX: 408-635-4986
E-mail: judy_dale@credence.com
SOURCE Credence Systems Corporation
 back to top
Related links:
http://www.credence.com/
CONTACT:
Judy Dale, Vice President, Marketing
Communications and Investor Relations, of Credence Systems
Corporation, +1-408-635-4309, FAX: +1-408-635-4986, or
judy_dale@credence.com
|
