SAN FRANCISCO, July 11 /PRNewswire-FirstCall/ -- SEMICON West --
Advantest Corporation (TSE: 6857, NYSE: ATE), the global leader in
semiconductor test, today unveils a new cost-effective, high-performance
16-channel mixed-signal module that enables testing of multi-site,
multi-channel SoCs used in applications such as mobile phones, set-top
boxes, DVDs, WLAN baseband, DSL, cable modems, HDTV and video graphics. The
product is making its debut at SEMICON West in San Francisco, California.
Designed with high integration, the Base Band Waveform Generator
Digitizer (BBWGD) Module's 16 channels satisfy diverse mixed-signal testing
needs -- such as DC, audio, video, base band, high frequencies -- on a
single board. This density provides the industry's highest performance
mixed-signal test module on the market for the lowest cost. In addition,
the diverse functionality allows semiconductor manufacturers to realize
higher utilization via fewer instruments; instead of separate audio, base
band, and high speed modules, manufacturers can now streamline operations
with one module. Advantest understands SoC customers' needs for efficient,
cost effective test, as well as their need for high-parallelism and
reliability to meet the challenges of the rapidly changing consumer
products IC market.
The Leader in Filling Customers' SoC Test Needs
The BBWGD module further optimizes the benefits of Advantest's T2000
Open Architecture Test Platform. The T2000 is the industry's only test
platform based on OPENSTAR(R) open architecture specifications introduced
by the not- for-profit Semiconductor Test Consortium. OPENSTAR(R) is a
truly open, non- proprietary architecture -- that is, its specifications
are open to the public and to all developers. The adaptability and
interoperability of the T2000 make it ideally suited to the demands of SoC
test and, in fact, industry acceptance of the T2000 has propelled Advantest
to the leadership position in the SoC test market.
Tom Brennan, product engineer for the BBWGD module, says, "Advantest is
unique in offering this high-density, high-performance, and wide bandwidth
in a low cost module. Other modules may have some features of Advantest's
BBWGD, but no other module delivers this magnitude of performance and
density at this price point per channel. The combination of the T2000 with
our new BBWGD module gives semiconductor manufacturers a terrific
competitive advantage."
R. Keith Lee, president and CEO of Advantest America, adds, "Advantest
understands the cost, time and functionality challenges that semiconductor
manufacturers face, and our new BBWGD module is the latest example of how
Advantest focuses on customers' issues and develops the solution they need.
Advantest's reputation in providing high performance test solutions is
demonstrated once again by this new test instrument module, and it's a
testament to our engineers that they've achieved such a high level of
integration on a single module."
Benefits of Standard-setting Engineering
Customers can realize a number of benefits from the salient design
features of Advantest's new 16-channel mixed-signal module:
* Single instrument AWG/DIG solution: High 300MHz undersampling BW & high
16bit performance (THD <-80dBc) supports a variety of applications and
results in higher utilization, fewer ATE configuration complexities,
broader test coverage and faster test times from less averaging. High
density >2GHz BW path to loadboard enables excellent gain/phase
linearity and IQ pair matching.
* 8 differential 400Msps AWG's + 8 differential 128Msps Digitizer's enable
x4 DUT baseband testing per module.
* DSP based architecture: Offers higher integration, higher performance,
lower cost, simplified calibration, and proprietary I & Q channel
amp/phase matching. Higher performance means fewer samples, higher
yields, and faster test times. Local DSP hardware engine per baseband
digitizer minimizes DUT test times by avoiding transfer and central
processing of samples.
* Multi-DUT triggering: DUT independent triggering allows capturing fewer
samples in today's asynchronous designs by focusing on when the DUT is
ready rather than on when the tester is ready.
* Multiple Clock Domains: Channel independent clocking allows parallel
testing with multiple time domains per module. This feature eliminates
the need for test serialization thus providing quicker test times.
* Pattern burst/continue mode: Faster testing of multiple analog
waveforms triggered from digital, DUT, or other instruments.
* Built in PMU & calibration: Internal AWG to DIG loopback, internal 6.5
digit DVM access, and PPMU simplifies load board and maintains
calibrated performance to DUT.
Availability
Advantest is currently taking orders for the 16-channel BBWGD module,
which will be available September 2006. Pricing starts at under $50,000.
About Advantest
Advantest Corporation is the world's leading supplier of automatic test
equipment to the semiconductor industry. Advantest's SoC, logic, memory,
mixed-signal and RF testers and device handlers are integrated into the
most advanced semiconductor fabrication lines in the world. Founded in
Tokyo in 1954, Advantest established its North American subsidiary in 1982
and its European subsidiary in 1984. More information is available at
http://www.advantest.com.
SOURCE Advantest Corporation
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Related links:
http://www.advantest.com
CONTACT:
Amy Gold of Advantest America, Inc.,
+1-212-850-6670, a.gold@advantest.com, or Barbara Palmer of
Palmer Communications, +1-914-725-8057,
bpalmer@palmercommunications.com
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