2006 SEMI Award for North America Bestowed on Dr. Igor Khandros for
Contributions to Semiconductor Test
SAN JOSE, Calif., July 12 /PRNewswire/ -- SEMI today announced that the
2006 SEMI Award for North America will be presented to Dr. Igor Khandros,
CEO of FormFactor for his innovations in parallel testing, microspring
contactors and wafer probe cards. The industry honor will be presented at
the Standards and Technical Awards Reception, at 6:30 p.m. on the evening
of Tuesday, July 11, 2006 at the San Francisco Marriott.
"The technical innovations developed by Dr. Khandros have helped
reshape and redefine our industry's approach to test," said Stanley T.
Myers, president and CEO of SEMI. "On behalf of SEMI, I would like to
congratulate Dr. Khandros, and also express the sincere appreciation of
both SEMI and the industry as a whole for his innovative contributions and
dedication to the advancement of semiconductor manufacturing."
2006 SEMI Award for North America:
Dr. Khandros founded FormFactor in 1993, and continues to serve as its
chief executive officer and director. Since founding FormFactor, he has
taken the company from a private start-up to a publicly-traded entity with
industry- leading revenue growth rates. His vision for semiconductor
testing continues to drive technological innovation while ensuring a strong
bottom line.
Dr. Khandros' pioneering work in test is responsible for lowering test
costs through "parallelism," which is the testing of multiple die
simultaneously; increasing yield through the development of the
microspring, a very robust, low-force contactor with excellent electrical
performance characteristics resulting in superior test yields and high
uptimes; and enabling roadmaps, which have led the way toward meeting
customer requirements for tighter pad pitch, high pad density and lower
power.
Prior to founding FormFactor, Dr. Khandros served as vice president of
Development at Tessera, which he co-founded. Dr. Khandros holds an M.S.
degree in metallurgical engineering from Kiev Polytechnic Institute in
Kiev, Russia, and a Ph.D. in metallurgy from Stevens Institute of
Technology in New Jersey.
The SEMI Award for North America is the highest honor conferred by
SEMI, and has been presented annually since 1979 to honor individuals who
have made significant technical contributions to the semiconductor
industry. Nominations are accepted from individuals of North American-based
member companies of SEMI. Past award recipients include Walter Benzing and
Mike McNealy (1979) for epitaxial silicon deposition; Kenneth Levy (1983)
for automated photomask inspection; Jean Hoerni (1985) for the planar
process; Dan Maydan, Sass Somekh and David Wang (1988) for plasma etch; and
Bruce Deal (1998) for silicon oxidation.
SEMI is a global industry association serving companies that provide
equipment, materials and services used to manufacture semiconductors,
displays, nano-scaled structures, micro-electromechanical systems (MEMS)
and related technologies. SEMI maintains offices in Austin, Beijing,
Brussels, Hsinchu, Moscow, San Jose (Calif.), Seoul, Shanghai, Singapore,
Tokyo and Washington, D.C. For more information, visit http://www.semi.org.
SOURCE SEMI
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Related links:
http://www.semi.org/
CONTACT:
Scott Smith of SEMI, +1-408-943-7957, or
ssmith@semi.org
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