Unparalleled flexibility provides lowest cost of ownership for multi-site
production testing
SAN FRANCISCO, July 14 /PRNewswire-FirstCall/ -- Advantest Corporation
(TSE: 6857, NYSE: ATE), the world's leading supplier of semiconductor test
equipment, is introducing its new 12GHz RF test cell solution at Semicon
West and demonstrating a new 12GHz RF module for the T2000
open-architecture SoC test system. Advantest will exhibit its products and
technology in West Hall booth 7447, on July 15 through 17, at San
Francisco's Moscone Center. Advantest's new, powerful RF test cell consists
of the T2000 LS mainframe configured with the new 12GHz RF module and
integrated with the M4841 Handler, using a unique low noise parallel
interface that offers the industry's only single-vendor, quad-site parallel
testing environment.
The RF test cell solution from Advantest incorporates the ATE
industry's first fully integrated 12 GHz quad-core monolithic test module.
Currently capable of testing 4 RF devices in parallel, this air-cooled,
parallel, quad-DUT module affords manufacturers an unmatched cost of test
advantage. Furthermore, with 32 RF pins, each with access to high
performance VSG and VSA supporting 40 MHz of complex modulation bandwidth,
this module offers the industry's highest RF pin density for addressing
multi-DUT, multi-band transceivers and Multiple Input Multiple Output
(MIMO) device architectures. The tester and handler are integrated into a
test cell with proprietary interface design that optimizes performance,
maintainability, functionality and throughput for superior cost of
ownership performance.
At Semicon, Advantest will demonstrate its multi-DUT RF solution
enabling tools through a high-speed link with its Gunma facility, on a
remote WiMAX quad-DUT device.
Turnkey RF test cell solution redefines "high-volume" manufacturing
Advantest's new RF test cell solution is unique for its single-vendor
tester-handler integration, bringing a highly parallel, high-performance,
turn-key manufacturing test solution to RF device manufacturing. The RF
test cell solution has a number of uniquely optimized features that offer
semiconductor designers, manufacturers and assembly-test companies high
performance, high accuracy, and turn-key ease of use at low cost of test.
-- Highest density RF module instrumentation at 32-12GHz ports routed
to 4-vectored sources and receivers allows dedicated resources to every
complex RF SOC device pin.
-- Scalability to an unprecedented 128 RF ports and 16-vectored sources
and receivers.
-- Multi-site innovation and patent pending RF shielding to improve
yield.
-- 36 port quad-core RF simplifies correlation provides faster time to
market.
-- Plug-n-Play high-performance site isolator module supports volume
production.
-- ATE industry's first fully integrated 12 GHz quad-core monolithic RF
module.
-- Optimized handler-tester connectivity for superb uptime, reliability
and ease of use.
-- OPENSTAR(R)-compliant open test system architecture and the latest
pick-and-place handler technology providing flexibility and scalability
that leverage ATE investment while meeting the challenges of testing
complex, sophisticated ICs.
-- An extremely compact ATE footprint, resulting in real estate and
operating savings.
Tester/Handler Characteristics
OPENSTAR(R) compliant and designed for compactness and modularity,
Advantest's T2000 LS mainframe is a low-cost test system for today's
high-functionality SoC consumer devices. Demand is ongoing and growing for
analog, digital and mixed signal devices that provide features and mobile
communications for increasingly sophisticated consumer electronics as well
as automotive, medical, transportation and other infrastructure
applications. These highly sophisticated, densely designed integrated
circuits (ICs) and the fast-paced, price-sensitive markets they target,
require test solutions that meet their technical challenges as well as
their cost challenges. Advantest designed the T2000 LSMF and its entire
test cell solution to meet these needs.
The test head of the LS mainframe is designed to accommodate different
modules for the varied applications needed to test complex SoCs. Offering
high-speed analog, digital and RF test capability to perform highly
parallel testing of complex SOC devices, Advantest's new solutions deliver
significant cost reductions and a smaller footprint, together with greater
performance and versatility.
Rounding out the test cell is Advantest's M4841 Dynamic Handler.
Offering industry-leading high-throughput handling for volume testing of
consumer devices such as MCUs and DSPs, the handler supports complex ICs
and their advanced packaging technologies, including BGA, CSP and QFP. The
M4841 is capable of parallel testing up to 16 devices and delivers a high
throughput of 18,500 devices-per-hour.
About Advantest
Advantest Corporation is the world's leading supplier of automatic test
equipment (ATE) to the semiconductor industry. Advantest's SoC, logic,
memory, mixed-signal and RF testers and device handlers are integrated into
the most advanced semiconductor fabrication lines in the world. Founded in
Tokyo in 1954, Advantest established its North American subsidiary in 1982
and its European subsidiary in 1984. More information is available at
http://www.advantest.com.
SOURCE Advantest Corporation
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Related links:
http://www.advantest.com
CONTACT:
Amy Gold of Advantest America, Inc.,
+1-212-850-6670, a.gold@advantest.com
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