Introduces Fully Integrated RF Test Cell Solution and demonstrates new,
compact, cost effective, SoC Test Solution for Digital Consumer and
Mixed-Signal ICs
SAN FRANCISCO, July 14 /PRNewswire-FirstCall/ -- Advantest Corporation
(TSE: 6857, NYSE: ATE), the world's leading supplier of semiconductor test
equipment, is introducing its new, high- performance RF test cell solution
at Semicon West, and is also demonstrating its new compact test solution
for cost sensitive consumer devices. In its booth #7447 West, Advantest
will also feature its suite of memory solutions for high-productivity, low
cost-of-ownership engineering and manufacturing applications. Semicon West
is being held from July 15-17 at San Francisco's Moscone Center.
Long the established leader in parallel test technology, Advantest is
now applying its multi-disciplined expertise in test cell technology to
revolutionize test in the SoC arena. Leveraging from decades of experience
and a significant global installed base of test-cells, Advantest has now
upped the performance standards for SoC test with the industry's only
single, monolithic, highly parallel, turn-key test cell solution for RF and
cost-sensitive consumer SoCs. The only ATE company which designs and
manufactures its own handlers, interfacing, and testers, Advantest stands
alone in offering customers a fully integrated, high-performance SoC test
cell solution that significantly lowers the cost of test for today's
complex consumer ICs.
Advantest's introduction of a turn-key RF test cell solution offers the
industry a new paradigm of test for today's demanding RF devices.
Advantest's turnkey, highly parallel solution is comprised of the new T2000
LS mainframe and new 12GHz RF module along with its new M4841
state-of-the-art handler and a unique low noise, highly parallel DUT
interface, yielding a complete test cell optimized for quad-device RF
parallel testing. Customers can benefit from Advantest's significant
experience in testers, handler, and interface design to speed deployment of
challenging RF test solutions significantly reducing risk and time to
volume. This test-cell solution provides the industry's lowest cost of
ownership for multi-site RF production testing.
Also at Semicon West, Advantest is showcasing its compact T2000 GS
mainframe solution which is designed to lower the cost-of-test of SoC
devices used in digital consumer, RF and mixed-signal products. The compact
solution, which debuted at Semicon Japan in December 2007, incorporates the
newly developed T2000 GS mainframe, together with new air-cooled 250MDMA
digital test module, which includes a high-performance hardware histogram
capability to enable a very high-speed parallel SOC test solution with a
very low cost- of-test.
Industry's first 12GHz monolithic module with quad density RF signal
generators and analyzers
Advantest's T2000 open-architecture SoC test system offers unparalleled
flexibility and a wide spectrum of modules to provide customers the lowest
cost of ownership for device testing today and into the future. Advantest's
new RF module is the ATE industry's first fully integrated 12 GHz
monolithic module, boasting 36-port quad-core RF signal generators and
analyzers to speed time to market. With an ability to test up to 4 RF
devices in parallel, this air-cooled, quad-DUT "out of the box module,"
affords customers an unmatched cost of test advantage. Additional modules
can be added within a single test head as needed. Furthermore, with 32 RF
pins per module, each with access to high performance VSG and VSA
supporting 40 MHz of complex modulation bandwidth, this module offers the
industry's highest RF pin density for addressing multi-DUT, multi-band
transceivers and Multiple Input Multiple Output (MIMO) device architectures
in both single and multi-site test configurations.
Addressing consumer market demands with high-parallel, compact test
solution
Consumer devices such as microcontrollers, and those used in hand-held
gadgets including cell phones and personal audio products, continue to
increase in functionality while experiencing significant price erosion, To
combat this trend, device manufacturers have been calling for an efficient,
low-cost test solution capable of addressing the manufacturing requirements
of both high-mix, low-volume and general purpose SoC devices. Advantest's
new T2000 Compact Test Solution responds to this need.
Advantest offers a wide range of high-end to mid-range SoC consumer
device test solutions through its T2000 test system series. The latest
mainframe addition to the T2000 test system family is the new GS mainframe.
Its small compact design, air-cooled test head, and single phase power
maximize floor space and power valued in both development and high-volume
production. Together with the new air-cooled 250MDMA digital test module,
this solution enables low cost high-parallel testing of SoC devices. This
high-density packaging 250MDMA module technology offers 128 channels per
module at test speeds of 250Mbps. The GS mainframe supports up to 32-device
parallel testing with even higher site counts available with other T2000
mainframes.
R. Keith Lee, president and CEO of Advantest America, says, "Our
customers in the RF and consumer SoC segments of the industry are calling
for reliable, accurate high-volume test solutions for devices that are both
complex and dense. They face continual demands to lower test costs to keep
pace with the downward pricing pressures that characterize the current
market environment. Advantest is able to meet customers' needs by
leveraging the strengths of our test cell technology and product offerings.
Advantest stands alone as a single vendor for turn-key, high-performance
test cells. The company's long history of delivering technically superior,
cost-effective test cell solutions in the memory market, has paved the way
for a transition to the SoC arena, where diverse engineering and
applications resources give Advantest significant technology to draw upon."
Advantest is also participating in the SEMI TechXPOT technology session
addressing Testing Increased Functional Complexity, on Wednesday, July 16.
Anthony Lum, an Advantest America SoC Product Engineer, will discuss
"Breaking the Barriers to RF Multi-DUT Tests" in his presentation.
About Advantest
Advantest Corporation is the world's leading supplier of automatic test
equipment (ATE) to the semiconductor industry. Advantest's SoC, logic,
memory, mixed-signal and RF testers and device handlers are integrated into
the most advanced semiconductor fabrication lines in the world. Founded in
Tokyo in 1954, Advantest established its North American subsidiary in 1982
and its European subsidiary in 1984. More information is available at
http://www.advantest.com.
Semicon West Booth No. 7447
SOURCE Advantest Corporation
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Related links:
http://www.advantest.com
CONTACT:
Amy Gold of Advantest America, Inc.,
+1-212-850-6670, a.gold@advantest.com
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