TOKYO, Dec. 1 /PRNewswire-FirstCall/ -- Advantest Corporation (TSE: 6857,
NYSE: ATE), the global leader in semiconductor test systems, today introduced
its T6171 complementary metal-oxide semiconductor (CMOS) image-sensor test
system.  Responding to rapidly expanding demand for CMOS image sensors used in
digital cameras and camera-equipped cellular phones, Advantest has optimized
the new system to conduct high-speed test of up to eight devices in parallel.
The T6171 is being unveiled this week during SEMICON Japan, held December 1-3
at Makuhari Messe.
    Demand for CMOS image sensors, which offer small size and low power
consumption, continues to grow each year.  Recent technical innovations have
also opened up opportunities to develop highly sensitive sensors that would
enable shooting seamless video footage at several hundred frames per second.
Expectations are high for single-lens digital reflex cameras and
high-resolution digital video cameras, as well as more ambitious applications
such as industrial robots and on-board safety surveillance systems for
vehicles.
    On the other hand, sensor prices have been falling as fast as applications
have multiplied, necessitating low-cost production-test solutions.
Concurrently, efforts to reduce the number of components per sensor have
yielded sensors that combine image processing and analog conversion circuitry.
Solutions capable of performing more efficient tests on these combined
functions are thus required.
    Advantest's new T6171 features a high-speed, 125MHz (250 MHz in multi-pin
mode) digital test module that can be equipped with up to 256 channels.  It
supports both the high-speed image transmission functions of
ever-higher-performance CMOS image sensors, and also the increasing device pin
count associated with the consolidation of circuits such as high-speed A/D
converters and DSP.  The tester can also be equipped with up to four
high-speed image processors, making it capable of parallel-testing up to eight
devices.
    Moreover, the system boasts an optional analog image capture function that
supports a maximum measurement frequency of 80MHz and can be equipped with up
to eight channels.  This analog output gives the T6171 the added flexibility
to support measurement of the CMOS image sensors used in ordinary digital
single-lens reflex cameras.
    Also supporting CMOS image sensors with enhanced pixel counts, the T6171
has a maximum of 64 megapixels of high-speed (16 bit. 80Mbs) image-capture
memory.  This enables the tester to quickly read moving-image data such as
digital video, as well as high-quality data-intensive still images.  This
image-capture memory can cumulatively add up to 256 times the number of
real-time frames of image data grabbed from the device up to 256 times, making
it possible to average measurements on the microscopic level.  These 64
megapixels can also be used to test devices by measuring their smallest
possible total pixel count.
    Additionally, a two-bank memory parallel processing method has been
utilized to handle all image processing, including image data grabbing and
image processor data transfers.  This greatly reduces test times and
contributes significantly to the T6171's increased throughput.

     Key Specifications

     Target Device                      CMOS image sensors
     Digital        test speed               125 MHz (Pin Mux 250MHz)
               pin count                256 pin (maximum)
     Image Data Capture
               frequency                80MHz
               channel count            4 / 8 channels
     Maximum Pixel Input                67 megapixels
     Parallel Testing                        8 devices (maximum)
     DPS                                32 channels (maximum)
     UDC                                4 channels
     Software                           Viewpoint

    About Advantest
    Advantest Corporation is the world's leading automatic test equipment
supplier to the semiconductor industry, and also produces electronic and
optoelectronic instruments and systems.  A global company, Advantest has long
offered total ATE solutions, and serves the industry in every component of
semiconductor test: tester, handler, mechanical and electrical interfaces, and
software.  Its SoC, logic, memory, mixed-signal and RF testers and device
handlers are integrated into the most advanced semiconductor fabrication lines
in the world.  Founded in Tokyo in 1954, Advantest established its North
American subsidiary in 1982.  Advantest America, Inc. and Advantest America
R&D Center, Inc. are based in Santa Clara, Calif.  More information is
available at http://www.advantest.com.

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